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  1. The Thermo/FEI Scios located in WH172B focused ion beam (FIB) is primarily for making cross-section samples for study using SEM imaging and X-ray analysis. This process may possibly be followed by in-situ lift-out, thinning and polishing site-specific samples that are ready for TEM or STEM.

  2. This course is designed for those using or are interested in using the FIB or FIB/SEM platforms in academic, governmental, or industrial laboratories in either the physical or biological sciences.

  3. Nov 28, 2022 · Researchers across Lehigh University’s colleges and departments will soon be able to conduct experiments using a new, state-of-the-art plasma focused ion beam system, or FIB, together with the capability for in situ mechanical testing at various temperatures between minus 130 and 1000 degrees Celsius.

  4. Lehigh hosts one of the most extensive suites of electron microscopy instrumentation in the world. From cutting edge TEM, SEM and FIB, to microscopes designed for hands-on student learning, the microscopy facility is well-suited to tackle a wide range of research challenges and train the next-generation of electron microscopy leaders.

  5. Lehigh University. image: A new, state-of-the-art plasma focused ion beam system (FIB), together with the capability for in situ mechanical testing at temperatures between minus 130 and 1000...

  6. Nov 29, 2022 · A cutting-edge plasma-focused ion beam system, or FIB, with the capacity for in situ mechanical testing at temperatures between −130 and 1000 °C, will soon allow researchers from across the colleges and departments of Lehigh University to conduct experiments.

  7. The Institute for Functional Materials & Devices (I-FMD) pursues innovative new materials and devices that underpin many of society’s greatest challenges, from detecting and treating disease, to implementing large-scale renewable energy sources, to securing food and fresh water for all.

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