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X-ray diffraction and X-ray reflectivity can provide non-destructive, reliable and accurate data for the characterization of thin films. Empyrean enables the determination of ultra-fast reciprocal space maps, X-ray reflectivity and rocking curve analysis.
Overview. The Empyrean X-ray Diffractometer from PANalytical B.V. is a multipurpose research diffractometer that can be used in powder, medium-resolution and high-resolution configurations and is ideally suited for in situ / operando x-ray studies of the materials in controlled environments and as they evolve during operation.
X-ray scattering and difraction are powerful and versatile nanometrology tools for the determination of nanoscale dimensions, shapes and structures, as well as the analysis of crystalline phases and local atomic structures. Empyrean delivers most accurate scattering data.
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Jul 27, 2017 · The Empyrean Nano edition is a dedicated X-ray scattering platform which enables a variety of X-ray scattering techniques that can be applied for the structural characterization of (nano)materials on multiple length scales.
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Empyrean X-ray diffractometer is a versatile platform for non-destructive materials investigation. X-ray diffraction (XRD) and scattering give insight into lattice parameters, crystallographic structures, oxidation stages, and particle size.
