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The Empyrean Tube is specially designed for PANalytical’s Empyrean, X’Pert PRO, X’Pert3, CubiX PRO and CubiX3 diffractometers. It integrates perfectly into the X-ray optical path, providing the best possible analytical performance.
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X-ray difraction and X-ray reflectivity can provide non-destructive, reliable and accurate data for the characterization of thin films. Empyrean enables the determination of ultra-fast reciprocal space maps, X-ray reflectivity and rocking curve analysis.
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- Solutions to Maximize The Return on Your Investment
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To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime 1. Phone and remote support 2. Preventive maintenance and checkups 3. Flexible Customer Care Agreements 4. Performance certificates 5. Hardware and software upgrades 6. Local and global support
Adding value to your processes 1. Sample preparation development/optimization 2. Analytical methodologies 3. Turnkey solutions for XRD 4. Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies 5. Consultancy services
Training on-site or at our competence centersBroad range of basic and advanced courses on products, applications and softwareAn X-ray mirror and a high-resolution monochromator are placed in line to deliver an incident X-ray beam that is not only highly monochromatic with a low divergence, but also has a high intensity. Reflectometry measurements can also be performed to identify layer thickness, density and surface roughness.
The Malvern PANalytical Empyrean generates x-rays, directs them toward the sample, and the diffracted rays are collected. A key component of diffraction is the angle between the incident and the diffracted beam.
It offers all relevant diffraction geometries: reflection, transmission, capillary, microdiffraction and Debye-Scherrer. The diffractometer uses exchangeable x-ray tubes from softer (Cu source, 8.04 keV) to medium (Mo source, 17.44 keV) up to hard (Ag source, 22.10 keV) radiations.
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The system offers an affordable solution for high-throughput, high-quality phase identification and quantification, residual stress analysis, grazing incidence diffraction, X-ray reflectometry, small-angle X-ray scattering, pair distribution function analysis and non-ambient diffraction. Read more.
